Characterization of microparticles and oxide layers generated by laser irradiation of diamond-machined silicon wafers

Author: Yan Jiwang   Sakai Shin   Isogai Hiromichi   Izunome Koji  

Publisher: IOP Publishing

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.26, Iss.2, 2011-02, pp. : 25006-25012

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract