HRTEM study of Si 1-x Ge x multilayer

Author: Werckmann J.   Ulhaq-Bouillet C.   Romeo M.   Chelly R.   Teodorescu C.   Ghica C.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.294, Iss.1, 1997-02, pp. : 80-83

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Abstract