![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Su C.Y. Wu S.L. Jinn Chang S. Chen L.P.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.369, Iss.1, 2000-07, pp. : 371-374
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Role of hydrogen during Si capping of strained Ge or Si 1-x Ge x hut clusters
By Dentel D. Bischoff J.L. Kubler L. Bolmont D.
Thin Solid Films, Vol. 336, Iss. 1, 1998-12 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Growth of strained Si/Si 1-y C y /Si 1-x Ge x structures by MBE
By Joelsson K.B. Ni W.-X. Pozina G. Hultman L. Hansson G.V.
Vacuum, Vol. 49, Iss. 3, 1998-03 ,pp. :