Hydrogen passivation and junction formation on APIVT-deposited thin-layer silicon by hot-wire CVD

Author: Wang T.H.   Wang Q.   Page M.R.   Bauer R.E.   Ciszek T.F.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.430, Iss.1, 2003-04, pp. : 261-264

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content