An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures

Author: Zivkovic V.A.   Tangelder R.J.W.T.   Kerkhoff H.G.  

Publisher: Springer Publishing Company

ISSN: 0923-8174

Source: Journal of Electronic Testing, Vol.18, Iss.2, 2002-04, pp. : 203-212

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