Magnetic emission mapping for passive integrated components characterisation

Author： Crepel O.   Desplats R.   Bouttement Y.   Perdu P.   Goupil C.   Descamps P.   Beaudoin F.   Marina L.  

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1809-1814

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