Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits

Author： Andriamonje G. Pouget V. Ousten Y. Lewis D. Danto Y. Rampnoux J.M. Ezzahri Y. Dilhaire S. Grauby S. Claeys W. Rossignol C. Audoin B.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1803-1807

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