Author: Muratet S. Fourniols J. Soto-Romero G. Endemano A. Marty A. Desmulliez M.
Publisher: Elsevier
ISSN: 0026-2714
Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1945-1949
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Modeling and Simulation, Vol. 02, Iss. 02, 2013-05 ,pp. :