Effects of Zn/Mg Ratio on the Microstructure and Microwave Dielectric Properties of (Zn 1−x Mg x ) 2 SiO 4 Ceramics

By Li Lingxia  

Journal of Electronic Materials, Vol. 41, Iss. 4, 2012-04 ,pp. : 684-688

Springer Publishing Company

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Characterization of thin and ultra-thin SiO 2 films and SiO 2 /Si interfaces with combined conducting and topographic atomic force microscopy

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Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. : 1465-1470

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Effect of SiO 2 Powder on Mirror Polishing of InP Wafers

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Tunnelling currents through oxygen vacancies in ultrathin SiO2 layer

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International Journal of Electronics, Vol. 94, Iss. 11, 2007-11 ,pp. : 985-994

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Anisotropic Etching of SiO₂ in High-Voltage Gas-Discharge Plasmas

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Russian Microelectronics, Vol. 33, Iss. 3, 2004-05 ,pp. : 169-182

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