Author: Yablonskii G. Gurskii A. Lutsenko E. Marko I. Schineller B. Guttzeit A. Schön O. Heuken M. Heime K. Beccard R. Schmitz D. Juergensen H.
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.27, Iss.4, 1998-04, pp. : 222-228
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Abstract