Quantitative analysis of small amounts of cubic GaN phase in GaN films grown on sapphire

Author: Zhi D.   Tisch U.   Zamir S.   Wei M.   Zolotoyabko E.   Salzman J.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.29, Iss.4, 2000-04, pp. : 457-462

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Abstract