Phase Equilibria in the Ni-Sn-Zn System at 500°C

By Liang Jian-lie  

Journal of Electronic Materials, Vol. 40, Iss. 11, 2011-11 ,pp. : 2290-2299

Springer Publishing Company

Access to resources Recommend Favorite

Study of the Effects of Zn Content on the Interfacial Reactions Between Sn-Zn Solders and Ni Substrates at 250°C

By Wang Chao-hong  

Journal of Electronic Materials, Vol. 39, Iss. 11, 2010-11 ,pp. : 2375-2381

Springer Publishing Company

Access to resources Recommend Favorite

Time resolved study on Co/Ni/a-Si phase transition during isothermal annealing at 400 o C

By Alberti A.   Bongiorno C.   La Via F.   Cafra B.   Spinella C.  

Microelectronic Engineering, Vol. 70, Iss. 2, 2003-11 ,pp. : 191-195

Elsevier

Access to resources Recommend Favorite

Interfacial Reactions in Sn-0.7wt.%Cu/Ni-V Couples at 250°C

By Chen Sinn-wen   Chen Chih-chi  

Journal of Electronic Materials, Vol. 36, Iss. 9, 2007-09 ,pp. : 1121-1128

Springer Publishing Company

Access to resources Recommend Favorite

Experimental analysis of I-V and C-V characteristics of Ni/SiO 2 /4H-SiC system with varying oxide thickness

By Gupta Sanjeev K.   Azam A.   Akhtar J.  

Microelectronics International, Vol. 27, Iss. 2, 2010-05 ,pp. : 106-112

Emerald Group Publishing Ltd

Access to resources Recommend Favorite