Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi 4 Ti 3 O 12 and Bi 3.25 La 0.75 Ti 3 O 12 thin film capacitors

Author： Chu M.W.   Ganne M.   Tessier P.Y.   Eon D.   Caldes M.T.   Brohan L.  

Publisher： Elsevier

ISSN： 1369-8001

Source： Materials Science in Semiconductor Processing, Vol.5, Iss.2, 2002-04, pp. : 179-182

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