Author: Tillack B. Kruger D. Gaworzewski P. Ritter G.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.294, Iss.1, 1997-02, pp. : 15-17
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Olivares J. Martn P. Rodrguez A. Sangrador J. Jimenez J. Rodrguez T.
Thin Solid Films, Vol. 358, Iss. 1, 2000-01 ,pp. :
Atomic layer doping of SiGe - fundamentals and device applications
By Tillack B. Heinemann B. Knoll D.
Thin Solid Films, Vol. 369, Iss. 1, 2000-07 ,pp. :
By Dufour-Gergam E. Meyer F. Delmotte F. Hugon M.C. Agius B. Dutartre D. Warren P.
Thin Solid Films, Vol. 294, Iss. 1, 1997-02 ,pp. :