Surface leakage current related failure of power silicon devices operated at high junction temperature

Author: Nuttall K.I.   Buiu O.   Obreja V.V.N.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1913-1918

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