Author: Wang W. Huang R. Yang S. Zhang G. Zhang X. Wang Y.
Publisher: Elsevier
ISSN: 0038-1101
Source: Solid-State Electronics, Vol.47, Iss.10, 2003-10, pp. : 1735-1740
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Reliability characteristics of high-k dielectrics
Microelectronics Reliability, Vol. 44, Iss. 2, 2004-02 ,pp. :