Non-destructive characterization of strontium bismuth tantalate films

Author： Petrik P.   Khanh N.Q.   Horvath Z.E.   Zolnai Z.   Barsony I.   Lohner T.   Fried M.   Gyulai J.   Schmidt C.   Schneider C.   Ryssel H.  

Publisher： Elsevier

ISSN： 1369-8001

Source： Materials Science in Semiconductor Processing, Vol.5, Iss.2, 2002-04, pp. : 141-145

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