Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits

Author: Andriamonje G.   Pouget V.   Ousten Y.   Lewis D.   Danto Y.   Rampnoux J.M.   Ezzahri Y.   Dilhaire S.   Grauby S.   Claeys W.   Rossignol C.   Audoin B.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1803-1807

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Abstract