High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's

Author： Kuchenbecker J. Borgarino M. Zeuner M. Konig U. Plana R. Fantini F.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1719-1723

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