Author： Martin J.C. Maneux C. Labat N. Touboul A. Riet M. Blayac S. Kahn M. Godin J.
Publisher： Elsevier
ISSN： 0026-2714
Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1725-1730
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