Edge direct tunneling current in nano-scale MOSFET with high- K dielectrics

Author: Yang Jian-hong   Li Gui-fang   Liu Hui-lan  

Publisher: Emerald Group Publishing Ltd

ISSN: 1356-5362

Source: Microelectronics International, Vol.25, Iss.1, 2007-12, pp. : 30-33

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Abstract