Author: Farcy A. Torres J. Arnal V. Fayolle M. Feldis H. Jourdan F. Assous M. Di Maria J.L. Vidal V.
Publisher: Elsevier
ISSN: 0167-9317
Source: Microelectronic Engineering, Vol.70, Iss.2, 2003-11, pp. : 368-372
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